The EM unit is equipped with state-of-the-art equipment and employs up-to-date techniques. Equipment includes: Analytical Electron Microscope; Scanning Transmission Electron Microscope (STEM) – JEOL JEM-1200EX (Voltage: 120kV – Resolution: Lattice: 0.14nm, Point: 0.2 nm, Magnification: X50 – X500, 000). Digital Transmission Electron Microscope (DTEM) – JEOL JEM-1230 (Voltage: 120kV – Resolution: Lattice: 0.14nm, Point: 0.2 nm, Magnification: X50 – X600, 000, CCD camera attachment: Gatan 792). Transmission Electron Microscope (with TV Rate Digital Camera) – Ziess EM 900 (Voltage: 80kV – Resolution: Lattice: 0.344nm, Point: 0.5 nm, Magnification: X150 – X280, 000). Low Vacuum/Environmental Scanning Electron Microscope (LVSEM) – JEOL JSM-5600LV (Voltage: 30kV – Resolution: High vacuum: 3.5nm, Low vacuum: 5.0 nm, Magnification: X18 – X300, 000, Detectors: SE, BSE). Energy Dispersive Spectroscope (EDS) – OXFORD (Inca) X-Ray Microanalysis system attached to LVSEM.