Field Emission Scanning Electron Microscope

Model: JSM-7600F Schottky Field Emission Scanning Electron Microscope

Make: Jeol company, Japan

Features:

• Semi in-lens SEM with high resolution: The adoption of a High Power Optics irradiation system delivers high-resolution, high-speed, high-accuracy element analysis. The incorporation of the Gentle Beam enables top-surface imaging of a specimen at very low energies of several hundred eV. Semi-in-lens provides high-resolution observation and analysis. High resolution observation and high spatial resolution analysis is achieved through the combination of a semi-in-lens type objective lens that can collimate the electron beam even at low accelerating voltages, and the in-lens Schottky electron source that provides a stable current over a long service life.
• Gentle Beam (GB) provides top-surface imaging with ultra-low energy incident electrons A Gentle Beam (GB mode) with better resolution than the normal mode is available. In GB mode a bias voltage is applied to the specimen while the electron beam is emitted, allowing top-surface imaging with only several hundred eV of incident electron, making it possible to obtain high resolution images of samples that have been difficult to observe until now.
• High Power Optics delivers high-speed, high-precision analysis. High Power Optics are adopted for the optical system, providing not only high-resolution imaging, but also stably delivering high-speed, high-precision analysis, including element analysis.

Specifications:

X-Ray Diffraction

Make: Panalytical

Model: X’Pert Pr

Features:

• X-ray source: The Ceramic diffraction X- ray tube
• Tube Anode material: Cu (Ka 1.5405 Å)
• Working condition: 45 KV & 40 mA.
• Incident beam optics: Soller slit (0.04 rad), Ni-filter, interchangeable divergence fixed slits and masks.
• Diffracted beam optics: Soller slit (0.04 rad), interchangeable anti-scattering slit and Monochromator.
• Detector: X Celerator detector.
• Measurement range: 5º to 140º.
• Sample stage: fixed stage and spinner  with Automatic multi-sample changer (45 samples)
• Software: Data Collector, Data Viewer and HighScore pluse.
• Database: PDF-2 release 2012 (ICDD) and ICSD databases.
• Sample Holders: Sample holders are made of Aluminum, for powder samples.
• Zero background sample holder is an obliquely cutted silicon crystal, which can be used to mount very small amount of powder.

Wavelength Dispersive X-ray Fluorescence Spectrometry (XRF)

Model: Axios mAX

Make: PAN Analytical

Features:

• Sequential Wavelength Dispersive X-ray Fluorescence (WDXRF) technology with high efficiency and sensitivity coupled with Rhodium (Rh) target x-ray tube with an exciting voltage of 25 kV and operating current 160 mA.
• Equipped with the latest version of SuperQ software which is simple, intuitive program for routine quality control analysis instrument can be used by anyone.
• Analyze major and trace elements from sodium (Na11) to uranium (U92) in concentration ranges from ppm to high percentage (%).
• A robust technique, combining high precision and accuracy with straightforward, fast sample preparation.
• Provides qualitative, semi- quantitative to full quantitative information on a sample.
• High-capacity sample changer bed (up to 68 positions) for readily automated use in high throughput applications.