Model: JSM-7600F

Make: JEOL company, Japan

Features and uses:

• SEM: is an advanced tool for high-resolution surface analysis, widely used in life sciences, metallurgy, and semiconductor inspection. It provides detailed insights into microstructure, chemical composition, and crystalline structures.

• Gun Type: Schottky Field-Emission Gun made of Zirconium Oxide.

• SEI Resolution: 1.0 nm at 15 kV, 1.5 nm at 1 kV.

• Detectors: Lower and Upper Secondary Electron, Backscattered Electron, EDS, and EBSD.

• Accelerating Voltage: 0.1 to 30 kV.

• Magnification: 25× to 1,000,000×.

• Sample Holders: 12.5 mm, 26 mm, multi-stub holder for 12.5 mm, and cross-section holder.

• Tilting Angle: -5° to 70°.

• Specimen Stage: Eccentric, 5-axis motor control.

• Evacuation System: Two SIPs, TMP, RP.

For Detailed info:Instrument Informati...

Model: X’Pert Pr

Make: Panalytical, Netherlands.

Features and uses:

X-ray Diffraction (XRD): is a non-destructive rapid analytical technique that is primarily used to determine the crystallographic structure of a material and can provide information on unit cell dimensions. This technology can be used to measure both the physical and chemical properties of crystalline powders, thin films, and bulk solid materials.

· X' Pert Pro XRD: Identifies material phases, examines crystallography, peak patterns, and amorphicity.

·  X-Ray Diffractometer: Features a ceramic X-ray tube with Cu anode (λ = 1.5405 Å), 45 kV, 40 mA.

·  Detector: X'Celerator, measuring range 5º to 140º.

·  Sample Handling: Fixed stage, spinner, and automatic multi-sample changer for up to 45 samples.

·  Software & Databases: Includes Data Collector, Data Viewer, HighScore Plus, with PDF-5 (2024) and ICSD databases.

·Sample Holders: Stainless Steel for holder powder, zero background holder with oblique silicon crystal for small samples.

For Detailed info:XRD Information Shee...

Model: Axia ChemiSEM

Make: Thermo Fisher Scientific Company, Netherlands.

Features and uses:

·  High-Resolution Imaging: Equipped with a thermal emission SEM column with tetrode source with a resolution of 3.0 nm at 30 kV, 8.0 nm at 3 kV.

·  Detectors: ETD: Everhart-Thornley SE detector , TrueSight X EDS detector , Low-vacuum SE detector (LVD) and Retractable under-the-lens backscatter detector.

·  Operational Range: Accelerating voltage 200 V to 30 kV, magnification 5× to 1,000,000×, multi-stub holder for up to 7 stubs.

·  Specimen Stage: 5-axis motor control, tilting angle from -15 to +90 degrees.

·  Applications: Surface detection, contamination examination, microstructure analysis, spatial variation in chemical compositions, and crystalline structure identification.

•   Wide Utilization: Essential in life sciences, biology, medicine, forensics, metallurgy, semiconductor inspection, and microchip assembly.

Model: MiniFlex 600.

Make: Rigaku Europe.

Features and uses:

X-ray Diffraction (XRD): is a non-destructive rapid analytical technique that is primarily used to determine the crystallographic structure of a material and can provide information on unit cell dimensions. This technology can be used to measure both the physical and chemical properties of crystalline powders, thin films, and bulk solid materials.

• Miniflex600 XRD

• Software: StudioII, (PDF-5 2024).

• Sample Holder: Zero background holder with oblique silicon crystal for small samples.

• Target Material: Copper (Cu) with an excitation voltage of 8.9 keV.

• Detector: HyPix-400, a pixelated X-ray detector.

Model: Axios mAX

Make: PAN Analytical Netherlands

Features and uses:

XRF Technology: For elemental analysis of geological samples (soil, cements, rocks).

• WDXRF: Sequential Wavelength Dispersive X-ray Fluorescence with high efficiency and sensitivity.

• X-ray Tube: Rhodium (Rh) target, excitation voltage 25 kV, operating current 160 mA.

• Software: SuperQ, analyzes major and trace elements from Na to U, ppm to high percentages.

• Capabilities: Qualitative, semi-quantitative, and full quantitative analysis with high-capacity sample changer for automated high throughput.

For Detailed info: XRF Instrument Infor...